AuthorsL. Yan, X. Lu, S. Xu, X. Chen, X. Zou, Y. Han, X.-H. SunVenueIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)DateMay, 2025TypeJournalDOI10.1109/TCAD.2025.3570164 (opens in a new tab)